Technical surfaces
Motivation
The functional behavior of a technical surface can essentially be influenced by structuring elements in micrometer and sub-micrometer size.
These structures can result on the surface through different manufacturing processes. For the evaluation of the manufactured surfaces and its structures in terms of functionality first of all measuring methods for capturing the surfaces are required. Often it is difficult to capture the relevant structures in micro- and sub-micrometer range. Especially undesirable physical interactions between the measuring system and the specimen surface can occur, which results in a distorted surface topography. As soon as a reliable capturing of the surface is possible, surface structures can subsequently be described by structure-oriented parameters.
The leading thought is to develop methods, which enable to identify and characterize the very structural elements, which essentially contribute to the function of a components’ surface.
Objectives
The initial aim for this project is to combine different measurement principle to a multi sensor system. In particular a combination of white-light interferometry and ellipsometry will be developed. The ellipsometry allows detecting regions of different materials. This is used to correct material-induced phase jumps at white-light interferometry.
When measuring with optical instruments usually only very small measuring fields (<1mm²) are captured. In order to cover larger regions and structures, single fields need to be composed to bigger arrays. This is achieved by Stitching algorithms.
In this project we develop merging algorithms which apply spatial coordinate transformations with translation and rotation of three-dimensional topographies.
Another field of research is three-dimensional roughness measurement.
The structure elements contained in the surface are extracted by means of morphological signal processing and are substituted by model elements with the purpose to describe its size, shape and position.
The long-term ambition of this project is to develop functionally relevant morphological parameters with the help of model structure elements based upon simulations and experimental studies within the scope of the whole SFB 926 project.
This results in parameters which are used to evaluate the capability of micro-structured surfaces for certain functions like e.g. friction, wear and impermeability. Furthermore it then should be possible to identify structural characteristics of the surface which optimize the suitability for a desired functionality.
Responsibility
Dipl.-Ing. Indek Raid
Partner
The presented project is a subproject of the SFB 926: Collaborative Research Center 926 – Microscale Morphology of Component Surfaces.
The SFB 926 is a joint project between several members from the department of mechanical & process engineering and the department of physics at the Technical University of Kaiserslautern and one nearby scientific Institute. An essential quality is the close cooperation between the subprojects. At the SFB 926 we cooperate in particular with the following institutions:
• Institute for Manufacturing Technology and Production Systems (FBK) (Lehrstuhl für Fertigungstechnik und Betriebsorganisation), Prof. Dr.-Ing. Jan Aurich and Juniorprofessor Dr.-Ing. Fábio Sousa
• Institute of Materials Science and Engineering (WKK) (Lehrstuhl für Werkstoffkunde), Prof. Dr.-Ing. Dietmar Eifler, Prof. Dr.-Ing. Eberhard Kerscher and Dr.-Ing. Marek Smaga
• Institute of Engineering Thermodynamics (LTD) (Lehrstuhl für Thermodynamik), Prof. Dr.-Ing. Hans Hasse
• Institute of Applied Mechanics (LTM) (Lehrstuhl für Technische Mechanik), Prof. Dr.-Ing. Ralf Müller
• Institute of Bioprocess Engineering (BioVT) (Lehrstuhl für Bioverfahrenstechnik), Prof. Dr. rer. nat. Roland Ulber
• Institute of Particle Process Engineering (MVT) (Lehrstuhl für Mechanische Verfahrenstechnik), Prof. Dr.-Ing. Siegfried Ripperger
• Institute of Machine Elements, Gears and Transmissions (MEGT) (Lehrstuhl für Maschinenelemente und Getriebetechnik), Prof. Dr.-Ing. Bernd Sauer
• Lehrstuhl für Computersimulation und Materialwissenschaften (CMS), Prof. Herbert Michael Urbassek
• Lehrstuhl für Technische Physik (LTP), Prof. Dr. rer. nat. Christiane Ziegler and Dr. rer. nat. Christine Müller
• Institute for Surface and Thin Film Analysis (IFOS) (Institut für Oberflächen- und Schichtanalytik GmbH), Prof. Dr. rer. nat. Michael Kopnarski
Publications
For any further information please visit the SFB 926 project website.